JOURNAL 3333
Journal of Chemical Metrology
Available Online: November 02,2024
p.1 - 12
http://doi.org/10.25135/jcm.116.2409-3333 (DOI number will be activated after the manuscript has been available in an issue.)
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GRAPHICAL ABSTRACT
ABSTRACT
This study involves the characterization of a new shortwave NIR wavelength standard solution to address the current limitations of shortwave near infrared (NIR) standard materials and to expand the spectral wavelength range of standard materials. Herein, an innovative use of a solution of dysprosium oxide and ytterbium oxide compounds dissolved in perchloric acid solution to calibrate and verify the NIR wavelength of a high-sensitivity ultraviolet-visible-near infrared spectrophotometer is reported. This standard material enables the near infrared wavelength to be accurately traced to the theoretical emission wavelength of the elements. In the study, cubic spline interpolation was performed on the SI traceable and validated instrument for the determination of peak wavelengths. The wavelength standard values of this standard material cover the shortwave near infrared region (700~1200 nm) with an uncertainty of 0.12 nm at a 95% confidence interval.
KEYWORDS- short-wavelength near-infrared
- argon emission lines
- wavelength calibration
- rare earth elements
- reference material
